Array Vision Inspection Machine
Model: CTV-110
This model is suitable for surface appearance inspection of plate-like products, such as ceramic substrates, LED sheets, wafer dies, and even products within trays. The items to be inspected move on a 2D platform and are captured dynamically with a high-speed shutter, ensuring images are blur-free and maintaining high inspection efficiency. Each item uses an independent and symmetrical lighting system to ensure consistent illumination. With an area scan camera and self-developed positioning algorithms, requirements for positioning accuracy are reduced, lowering maintenance costs. Suitable inspection modes are provided for different products, with highly adjustable inspection items. The interface is user-friendly and easy to operate. Production data is displayed in real-time on the screen, and reports can be generated quickly. Each camera can store up to 1000 sets of images, allowing for fast and accurate parameter setting via simulation functions. Equipped with an industrial computer and camera in a fanless design, machine reliability and lifespan are significantly improved. Both hardware and software are developed in-house, allowing for customization and timely service based on customer needs.
Features
- Platform movement speed up to 500mm/sec, with a working range of up to 150mm.
- Image capture speed up to 750 frames per second (using a 0.3MP camera).
- Optional ultra-high-resolution cameras available, up to 12MP, effectively revealing tiny defects even in large fields of view.
- Can support up to two cameras for double-sided inspection or repeated inspection under different lighting conditions.
- Vision inspection functions include various dimension measurements, pitch measurements, mark recognition, etc.
- Provides 17 completely independent defect inspection items, with conditions settable for different zones to reduce false positives.
- Simulation and classification function with 1000 workpiece images assists in adjusting vision parameters, increasing reference reliability.
- Automatically generates production reports and records defect counts; defect images can be exported to external devices for QC tracking and process improvement.
- All defect items can be assigned priority levels, helping on-site personnel quickly judge defect severity.
- Loading/unloading mechanisms can be customized according to requirements.
Applicable Products
- Ceramic Substrates
- LED Sheets
- Wafer Dies
- Inspection of Workpieces in Trays
- Various Planar Products
Main Inspection Items
- Dimension Measurement
- Pitch Measurement
- Mark Recognition
- Foreign Object Detection
- Damage/Breakage Detection
- Crack Detection
- Color Difference Detection
Video Introduction
Ceramic Substrate Inspection Demo
The product inspected is a 7mm x 6mm ceramic substrate, using two cameras for double-sided inspection. Total inspection time is about 8 seconds, or 10 seconds including loading/unloading.