Array Vision Inspection Machine
Model: CVT-110
Product Overview
CVT-110 is suitable for ceramic substrates, wafer dies, and uncut sheet-product inspection. It uses a linear motor and high-resolution optical scale with a line-scan camera for high-precision, high-consistency continuous inspection.
Why Choose CVT-110
Key Features
- Uses 64-bit Windows 10/11 with both stability and usability.
- Line-scan camera continuously captures large-area images and reduces geometric distortion.
- Displays brightness distribution and variation in real time for fast lighting/parameter adjustment.
- In-house software/hardware can be quickly adjusted by inspection conditions.
Implementation Flow
- Requirement interview: confirm product size, defect patterns, and target CT.
- Solution planning: define optical setup and inspection items.
- Pilot validation: verify detection and false-positive rates with samples.
- Implementation training: establish standard parameters and daily operation/maintenance workflow.
- Mass-production optimization: continuously adjust with on-site data.
Images
Equipment Appearance
Main Screen
Parameter Settings
Simulation and inspection screen
Video
Ceramic Substrate Inspection Demo
Inspected product: 7mm x 6mm ceramic substrate; total dual-side inspection time is about 10 seconds (including loading/unloading).
Wafer Inspection Demo
Applications
- Ceramic substrate
- Wafer
- Printed circuit board (PCB)
- Uncut sheet products
Primary Inspection Items
- Dimension, position, count measurement, and pattern matching
- Surface defects, hole inspection, foreign-material inspection, and breakage inspection
- Crack inspection and color-difference inspection
Datasheet
Related Resources
Use Cases
Optics and inspection flow can be tuned by substrate/wafer product characteristics to improve defect-recognition consistency and line-judgment stability.
FAQ
Can inspection mode switch by different defect types?
Yes. The system can set corresponding source modes and parameters by inspection target.
What information should be prepared before implementation?
Please provide product size, defect patterns, target CT, and judgment criteria.