High-speed Vision Inspection Module
Model: TEV-300
Product Overview
TEV-300 can be installed on test-and-pack/taping machines and supports up to three independent cameras for high-speed dimensional checks, defect inspection, empty-pocket checks, and side-flip checks on tray/tape components. Inspection standards and dedicated software can be built from customer samples.
Why Choose TEV-300
<4ms
Vision processing time (MLCC type)
6,000 pcs/min
Maximum delayed displacement output speed
3 camera groups
Synchronous multi-station inspection
Key Features
- 64-bit Windows 10/11 platform with stable and complete functionality.
- Ultra-high-speed industrial camera + USB3.0 transfer, no dedicated capture card required.
- Supports real-time image, brightness curve, zoom view, and rapid parameter switching.
- Supports secondary imaging and delayed output with test-and-pack machines without affecting takt.
Implementation Flow
- Confirm machine interface signals, part type, and target takt.
- Establish inspection standards and judgment rules.
- On-machine sampling and speed validation.
- Go-live implementation and operator training.
Images
Technical Specifications
- Image processing time: approx. 4ms (MLCC-type products)
- Maximum immediate output speed: approx. 3,000 pcs/min
- Maximum delayed output speed: approx. 6,000 pcs/min
Applications and Inspection Items
- Applications: MLCC, MLCI, resistors, inductors, diodes, LEDs, QFN, etc.
- Inspection: size/pitch measurement, electrode-shape defects, body contamination/cracks, marking checks, and color-difference checks.
Resources
Use Cases
Implementation Experience | High-Speed Vision Upgrade for Test-and-Pack Machines
A common need is improving detection rate without slowing down. Multi-camera task split and delayed-displacement output balance takt and judgment stability.
FAQ
Can it be installed on existing test-and-pack machines?
Yes. We first evaluate I/O and trigger-feedback interfaces, then plan implementation.
Can inspection items be customized?
Yes. Inspection standards and dedicated workflows can be built from samples and defect definitions.




